National Center for High-Resolution Electron Microscopy

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For more information visit Polymer & Materials Chemistry

 

 

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Description of Our Instruments

The facility is equipped with three electron microscopes and one
multimode scanning probe microscope.

The nCHREM also provides equipment for element analyses,
specimen preparation, image calculation, processing and
documentation. The equipment will be described in some detail
below.

   
       
 
       
 

JEOL 3000F

An analytical high-resolution transmission electron with a field-emission electron source. The microscope is equipped with video rate camera, and a 2 x 2 k CCD camera for HR image recording. The structural resolution is 0.17 nm in conventional mode, and 0.13 nm in STEM mode with high-angle annular detector. The microscope has an SDD based Oxford XEDS system and a Gatan Imaging Filter (2 x 2 k) for analysis of chemical composition with a spatial precision below 1 nm. Specialised holders for specimen transfer at liquid nitrogen tempeature, in-situ heating, scanning tunneling microscopy with simultaneous TEM viewing etc are available. The microscope can be remote-controlled via Internet via a portable knobset.
Various calibrations can be found here

  The Jeol 3000F
   
 
       
 

Philips CM120 BioTWIN Cryo

The transmission electron microscope is specially designed for cryo and low dose imaging. The BioTWIN objective lens gives high contrast and resolution is 0.34 nm. The microscope is equipped with an energy filter imaging system (Gatan GIF 100) and digital multiscan CCD cameras (Gatan 791). There is an Oxford CT 3500 Cryoholder and transfer system.


 

Image of the CM 120 cryo-TEM from Philips

Plunge-freezed nanoparticles in liquids are easily studied with the cryo-TEM.

       
 
       
 

JSM-6700F

A scanning electron microscope especially suited for morphology studies and element analysis.

The microscope is equipped with an Oxford XEDS system using a large area SDD, capable of handling very high count-rates. The spectra may be quantified by a computer program for planar specimens, giving relative concentrations with an accuracy down to around 2 percent, or a program for rough samples, giving absolute quantities in a known matrix. Using energy-selective windows, concentration maps of selected elements can be obtained, together with the ordinary image.

 

Image og the JSM-840A scanning electron microscope

Frequently used for surface structure studies and element analysis.