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You are here: Home > Microscopes
Description of Our Instruments
The facility is equipped with four electron microscopes and one
multimode scanning probe microscope.
The nCHREM also provides equipment for element analyses,
specimen preparation, image calculation, processing and
documentation. The equipment will be described in some detail
below.
JEOL 3000F
An analytical high-resolution transmission electron with a field-
emission electron source. The microscope is equipped with video
rate camera, and a 2 x 2 k CCD camera for HR image recording.
The structural resolution is 0.17 nm in conventional mode, and
0.13 nm in STEM mode with high-angle annular detector. The
microscope has an Oxford XEDS system and a Gatan Imaging
Filter (2 x 2 k) for analysis of chemical composition with a spatial precision
below 1 nm. Specialised holders for specimen transfer at liquid nitrogen
tempeature, in-situ heating, scanning tunneling microscopy with simultaneous
TEM viewing etc are available. The microscope can be remote-controlled
via Internet via a portable knobset .
JEOL 3000SFF
This TEM includes a Helium cooled cryo transfer stage and a field emission
gun. The microscope is equipped with a 4096 by 4096 pixels Tietz CCD camera
for rapid high-resolution data collection. The attainable point resolution
of the microscope is better than 0.2 nm at 4.2 K
The combination of a highly coherent electron source and
specimen preservation at liquid Helium temperature give
opportunities for data acquisition at very high resolution.
Philips CM120 BioTWIN Cryo
The transmission electron microscope is specially designed for cryo and low dose imaging. The BioTWIN objective lens gives high contrast and resolution is 0,34 nm. The microscope is equipped with an energy filter imaging system (Gatan GIF 100) and digital multiscan CCD cameras (Gatan 791). There is an Oxford CT 3500 Cryoholder and transfer system.
(More information can be found at the Biomicroscopy Unit homepage.)
Plunge-freezed nanoparticles in liquids are easily studied with the cryo-TEM.
JSM-840A
A scanning electron microscope especially suited for morphology studies and element analysis.
The microscope is equipped with a ISIS 300 Microanalysis System and has a windowless detector for light element micro analysis. The spectra may be quantified by a computer program for planar specimens, giving relative concentrations with an accuracy down to around 2 percent, or a program for rough samples, giving absolute quantities in a known matrix. Using energy-selective windows, concentration maps of selected elements can be obtained, together with the ordinary image.
Frequently used for surface structure studies and element analysis.
Nanoscope III AFM
Our Multimode Scanning Probe Microscope (SPM) is the highest-resolution
SPM manufactured and can be operated in contact mode, non-contact,
or the dynamic high-amplitude mode called “tapping mode”. It
is equipped with the Extender Electronics Module that offers phase and
frequency detection capabilities for enhanced magnetic and electric force
microscopy.
The extender module also allows measurements of sample surface potential.
We have developed a tip-holder that allows us to image the tip apex at high resolution in our JEOL 2000FX transmission electron microscope. This has made it possible to study the effects of tip convolution and various imaging artifacts. Recently, we have upgraded the JEOL 2000FX microscope with a special TEM-SPM holder from Nanofactory allowing us to perform real-time imaging of STM events.
The Nanoscope III AFM could be used to study e.g. catalysts, polymers, and biological samples.