National Center for High-Resolution Electron Microscopy

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State of the Art Tools
for Electron Microscopy

The National Center for High Resolution Electron Microscopy (nCHREM) offers expertise in imaging, element analysis, and sample preparation for a wide variety of sample types.

A few examples of samples recently imaged at nCHREM

  • nanoparticles
  • semiconducting nanowires
  • crystalline mesoporous materials
  • nanotubes
  • protein adsoption on zeolites materials
  • binders
  • cells

We have equipment for plunge-freezing of liquids and cryogenic imaging. It is also possible to make thin slices by microtome sectioning, if required.

The facility is situated within the Chemical Center at Lund University, in southern Sweden.


 

Image of the JEOL 3000F

The Jeol 3000F analytical high-resolution (scanning) transmission electron microscope. Equipped with a SDD X-ray detector and a Gatan Imaging Filter. Attainable point resolution is 0.17 nm in conventional TEM and 0.13 for the high angle annular dark field detector in scanning mode.