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RESEARCH INSTRUMENTS SERVICES ABOUT nCHREM For more information visit Polymer & Materials Chemistry |
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State of the Art Tools
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The Jeol 3000F analytical high-resolution (scanning) transmission electron microscope. Equipped with a SDD X-ray detector and a Gatan Imaging Filter. Attainable point resolution is 0.17 nm in conventional TEM and 0.13 for the high angle annular dark field detector in scanning mode.
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